Contact: Mr Tan
Tel：0755-82954069
Email：Sales@g-tecs.com
Address：Shenzhen baoan district new an street buxin community 74 area yiyuan road no. 5175-1 runfengyuan C building 102
Technology-Based Thickness Measurement Solution for Revolutionary True 3D In-Line Dispensing Process Inspection (DPI)
Most optical systems use UV light to check for the presence of surfaces and gauges to measure the thickness of material at specific points, which does not provide the accuracy and repeatability required. Inspecting transparent materials is a challenge for traditional laser confocal or electron microscope systems that only measure three-dimensional shapes.
Koh Young's revolutionary Neptune C+ provides the ultimate solution to these challenges.
True 3D Contour Analysis
Koh Young has developed a non-destructive thickness measurement solution for transparent materials. The system allows manufacturers to explore the depth of their process and accurately identify defects through 2D, 3D and cross-sectional views.
The system accurately measures material coverage, thickness and consistency based on user-defined threshold settings. It can also detect bubbles and other defects as small as 200 microns, and can even detect splash marks as small as 100 microns in ‘no go’ areas.
Superior performance - LIFT technology
Artificial intelligence capabilities
High throughput
Simple, intuitive programming
Top and bottom inspection using flippers
Fully automated in-line inspection for extra-long applications possible
